Kapak Resmi

Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Energy efficiency plays a key role in the development of new industrial as well as daily life applications. There exists a strong demand for a new energy efficient generation of optoelectronic devices, especially in the growing market of internet data transfer where devices operate in the 1.55 µm...

Ful tanımlama

Kaydedildi:
Yazar: Knaub, Nikolai
Diğer Yazarlar: Volz, Kerstin (Prof. Dr.) (Tez danışmanı)
Materyal Türü: Dissertation
Dil:İngilizce
Baskı/Yayın Bilgisi: Philipps-Universität Marburg 2016
Konular:
Raster-Transmissions-Elektronenmikroskopie
Halbleiterphysik
Verdünnte Legierung
Bismut
Verbindungshalbleiter
Physik
semiconductor physics
Scanning transmission electron microscopy
dilute bismide alloys
III-V semiconductors
Physics
Online Erişim:PDF Tam Metin
Etiketler: Etiketle
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Internet

PDF Tam Metin

Yer Numarası: urn:nbn:de:hebis:04-z2016-06566
Yayın Tarihi: 2016-09-29
Datum der Annahme: 2016-06-23
Downloads: 24 (2025), 208 (2024), 110 (2023), 38 (2022), 42 (2021), 33 (2020), 22 (2019), 11 (2018)
Lizenz: https://creativecommons.org/licenses/by-nc-sa/4.0
Erişim Adresi URL: https://archiv.ub.uni-marburg.de/diss/z2016/0656
https://doi.org/10.17192/z2016.0656

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