Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM
In this study, the structural characterization of nanomaterials is performed by an extension of the established method which is used for quantitative STEM based on comparing the ADF-STEM image simulations and experiments. The limitations and capabilities of the method towards single atom accuracy ar...
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Materialtyp: | Dissertation |
Språk: | engelska |
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Philipps-Universität Marburg
2022
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Länkar: | PDF-fulltext |
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