Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM

In this study, the structural characterization of nanomaterials is performed by an extension of the established method which is used for quantitative STEM based on comparing the ADF-STEM image simulations and experiments. The limitations and capabilities of the method towards single atom accuracy ar...

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Bibliográfalaš dieđut
Váldodahkki: Firoozabadi, Seyyed Salehedin
Eará dahkkit: Volz, Kerstin (Prof. Dr.) (BetreuerIn (Doktorarbeit))
Materiálatiipa: Dissertation
Giella:eaŋgalasgiella
Almmustuhtton: Philipps-Universität Marburg 2022
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