Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM
In this study, the structural characterization of nanomaterials is performed by an extension of the established method which is used for quantitative STEM based on comparing the ADF-STEM image simulations and experiments. The limitations and capabilities of the method towards single atom accuracy ar...
Furkejuvvon:
Váldodahkki: | |
---|---|
Eará dahkkit: | |
Materiálatiipa: | Dissertation |
Giella: | eaŋgalasgiella |
Almmustuhtton: |
Philipps-Universität Marburg
2022
|
Fáttát: | |
Liŋkkat: | PDF-ollesdeaksta |
Fáddágilkorat: |
Lasit fáddágilkoriid
Eai fáddágilkorat, Lasit vuosttaš fáddágilkora!
|
No citations were found for this record.