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Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM
In this study, the structural characterization of nanomaterials is performed by an extension of the established method which is used for quantitative STEM based on comparing the ADF-STEM image simulations and experiments. The limitations and capabilities of the method towards single atom accuracy ar...
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| Формат: | Dissertation |
| Язык: | английский |
| Опубликовано: |
Philipps-Universität Marburg
2022
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| Online-ссылка: | PDF-полный текст |
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