Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM

Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM

In this study, the structural characterization of nanomaterials is performed by an extension of the established method which is used for quantitative STEM based on comparing the ADF-STEM image simulations and experiments. The limitations and capabilities of the method towards single atom accuracy ar...

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awdur: Firoozabadi, Seyyed Salehedin
Awduron Eraill: Volz, Kerstin (Prof. Dr.) (Cynghorydd traethodau ymchwil)
Fformat: Dissertation
Iaith:Saesneg
Cyhoeddwyd: Philipps-Universität Marburg 2022
Pynciau:
Raster-Transmissions-Elektronenmikroskopie
Image simulation
energiegefilterte STEM
Quantitative STEM
Inelastic scattering
Physik
Vierdimensionale STEM
Inelastische Streuung
Kompositionsbestimmung
Bildsimulation
Energy-filtered STEM
Four-dimensional STEM
Composition determination
Physics
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