Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

It is illustrated that the preparation of thin specimens from bulk materials can have significant influence on the interpretability of (S)TEM data. The results of the presented measurements show that and the elastic strain relaxation in low dimensional structures alters the overall strain state of t...

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主要作者: Belz, Jürgen
其他作者: Volz, Kerstin ( Prof. Dr.) (BetreuerIn (Doktorarbeit))
格式: Dissertation
語言:英语
出版: Philipps-Universität Marburg 2019
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索引號: urn:nbn:de:hebis:04-z2020-04870
Publikationsdatum: 2020-10-14
Datum der Annahme: 2019-10-14
Downloads: 123 (2024), 131 (2023), 82 (2022), 43 (2021), 8 (2020)
Lizenz: https://rightsstatements.org/vocab/InC-NC/1.0/
Zugangs-URL: https://archiv.ub.uni-marburg.de/diss/z2020/0487
https://doi.org/10.17192/z2020.0487