Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

It is illustrated that the preparation of thin specimens from bulk materials can have significant influence on the interpretability of (S)TEM data. The results of the presented measurements show that and the elastic strain relaxation in low dimensional structures alters the overall strain state of t...

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Autore principale: Belz, Jürgen
Altri autori: Volz, Kerstin ( Prof. Dr.) (Relatore della tesi)
Natura: Dissertation
Lingua:inglese
Pubblicazione: Philipps-Universität Marburg 2019
Soggetti:
Methode
Tetragonal Distortion
Tetragonale Verspannung
Imperfektionen
Verspannung
Physik
Aberrationen
Strain Relaxation
Ionenstrahlschaden
Ion Beam Damage
Imperfections
Aberrations
Raster-Transmissions-Elektronenmikroskop
Verspannungsrelaxation
Strain
Durchstrahlungselektronenmikroskop
Elektronenmikroskop
Physics
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Collocazione: urn:nbn:de:hebis:04-z2020-04870
Data di pubblicazione: 2020-10-14
Datum der Annahme: 2019-10-14
Downloads: 118 (2024), 131 (2023), 82 (2022), 43 (2021), 8 (2020)
Lizenz: https://rightsstatements.org/vocab/InC-NC/1.0/
URL di accesso: https://archiv.ub.uni-marburg.de/diss/z2020/0487
https://doi.org/10.17192/z2020.0487

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