Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

It is illustrated that the preparation of thin specimens from bulk materials can have significant influence on the interpretability of (S)TEM data. The results of the presented measurements show that and the elastic strain relaxation in low dimensional structures alters the overall strain state of t...

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Detalles Bibliográficos
Autor Principal: Belz, Jürgen
Outros autores: Volz, Kerstin ( Prof. Dr.) (BetreuerIn (Doktorarbeit))
Formato: Dissertation
Idioma:inglés
Publicado: Philipps-Universität Marburg 2019
Schlagworte:
Methode
Tetragonal Distortion
Tetragonale Verspannung
Imperfektionen
Verspannung
Physik
Aberrationen
Strain Relaxation
Ionenstrahlschaden
Ion Beam Damage
Imperfections
Aberrations
Raster-Transmissions-Elektronenmikroskop
Verspannungsrelaxation
Strain
Durchstrahlungselektronenmikroskop
Elektronenmikroskop
Physics
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Número de Clasificación: urn:nbn:de:hebis:04-z2020-04870
Data de Publicación: 2020-10-14
Datum der Annahme: 2019-10-14
Downloads: 123 (2024), 131 (2023), 82 (2022), 43 (2021), 8 (2020)
Lizenz: https://rightsstatements.org/vocab/InC-NC/1.0/
URL de acceso: https://archiv.ub.uni-marburg.de/diss/z2020/0487
https://doi.org/10.17192/z2020.0487

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