Surface-Assisted Chemistry at Interfaces between Metals and Organic Thin Films

Surface-Assisted Chemistry at Interfaces between Metals and Organic Thin Films

Interfaces between metals and organic thin films are of paramount importance for organic electronic devices. By photoemission spectroscopy (XPS), scanning tunneling microscopy/spectroscopy (STM/STS), temperature programmed desorption/reaction (TPD/TPR) and density functional theory calculations (DFT...

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Bibliografiske detaljer
Hovedforfatter: Chen, Min
Andre forfattere: Gottfried, J. Michael (Prof. Dr.) (BetreuerIn (Doktorarbeit))
Format: Dissertation
Sprog:engelsk
Udgivet: Philipps-Universität Marburg 2016
Fag:
Metallier
Corrol
Porphyrine
Ullmann-Kupplung
depth profile
metal-organic interface
Ullmann-reaction
Grenzphase
HAXPES
interphase
Tiefenprofil
Phthalocyanin
Rastertunnelmikroskopie
Röntgen-Photoelektronenspektroskopie
Chemie
Thermische Desorptionsspektroskopie
Metallorganische Grenzschicht
Chemistry & allied sciences
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