Investigation of light-induced defects in hydrogenated amorphous silicon by low temperature annealing and pulsed degradation

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Bibliographic Details
Main Author: Heck, Stephan
Format: Dissertation
Language:English
Published: Philipps-Universität Marburg 2002
Physik
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Online Access:PDF Full Text
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DOI:https://doi.org/10.17192/z2002.0408