APA (7. basım) Alıntı

Kükelhan, P. (2019). Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg. https://doi.org/10.17192/z2019.0483

Chicago Style (17. basım) Atıf

Kükelhan, Pirmin. Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg, 2019. https://doi.org/10.17192/z2019.0483.

MLA (9th ed.) Atıf

Kükelhan, Pirmin. Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg, 2019. https://doi.org/10.17192/z2019.0483.