PublikationsserverKükelhan, P. (2019). Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg. https://doi.org/10.17192/z2019.0483
Chicago-referens (17:e uppl.)Kükelhan, Pirmin. Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg, 2019. https://doi.org/10.17192/z2019.0483.
MLA-referens (9:e uppl.)Kükelhan, Pirmin. Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg, 2019. https://doi.org/10.17192/z2019.0483.
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