Style de citation APA (7e éd.)

Han, H. (2017). Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy. Philipps-Universität Marburg. https://doi.org/10.17192/z2017.0776

Style de citation Chicago (17e éd.)

Han, Han. Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2017. https://doi.org/10.17192/z2017.0776.

Style de citation MLA (9e éd.)

Han, Han. Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2017. https://doi.org/10.17192/z2017.0776.