Multi-mode atomic force microscope as a versatile tool for bionanotechnology

The kernel of this dissertation is multi-mode atomic force microscopy (AFM) which is a useful and powerful tool for characterizing and analyzing samples of nano- or micro size. Various modes can satisfy specified requirements according to different samples, i.e., topography, surface electrostatic...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile nagusia: Yang, Fang
Beste egile batzuk: Hampp, Norbert (Prof. Dr.) (Tesi aholkularia)
Formatua: Dissertation
Hizkuntza:ingelesa
Argitaratua: Philipps-Universität Marburg 2017
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