Παραπομπή σε μορφή APA (7η εκδ.)

Wegele, T. (2016). Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy. Philipps-Universität Marburg. https://doi.org/10.17192/z2016.0489

Παραπομπή σε μορφή Chicago (17η εκδ.)

Wegele, Tatjana. Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2016. https://doi.org/10.17192/z2016.0489.

Παραπομπή σε μορφή MLA (9th εκδ.)

Wegele, Tatjana. Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2016. https://doi.org/10.17192/z2016.0489.