APA (7th ed.) Citation

Wegele, T., & Volz, K. (2016). Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy. Philipps-Universität Marburg. https://doi.org/https://doi.org/10.17192/z2016.0489

Chicago Style (17th ed.) Citation

Wegele, Tatjana, and Kerstin Volz. Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2016. https://dx.doi.org/https://doi.org/10.17192/z2016.0489.

MLA (8th ed.) Citation

Wegele, Tatjana, and Kerstin Volz. Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2016.

Warning: These citations may not always be 100% accurate.