Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

Most of today’s electronic devices, like solar cells and batteries, are based on nanometer-scale built-in electric fields. Accordingly, characterization of fields at such small scales has become an important task in the optimization of these devices. In this study, with GaAs-based p−n junctions as t...

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Detaylı Bibliyografya
Asıl Yazarlar: Beyer, Andreas, Munde, Manveer Singh, Firoozabadi, Saleh, Heimes, Damien, Grieb, Tim, Rosenauer, Andreas, Müller-Caspary, Knut, Volz, Kerstin
Materyal Türü: Makale
Dil:İngilizce
Baskı/Yayın Bilgisi: Philipps-Universität Marburg 2021
Konular:
momentum-resolved STEM
4DSTEM
electric field measurements
Physik
p−n junctions
transmission electron microscopy
Physics
Online Erişim:PDF Tam Metin
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