Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

Most of today’s electronic devices, like solar cells and batteries, are based on nanometer-scale built-in electric fields. Accordingly, characterization of fields at such small scales has become an important task in the optimization of these devices. In this study, with GaAs-based p−n junctions as t...

Cijeli opis

Spremljeno u:
Bibliografski detalji
Glavni autori: Beyer, Andreas, Munde, Manveer Singh, Firoozabadi, Saleh, Heimes, Damien, Grieb, Tim, Rosenauer, Andreas, Müller-Caspary, Knut, Volz, Kerstin
Format: Članak
Jezik:engleski
Izdano: Philipps-Universität Marburg 2021
Teme:
Online pristup:PDF cijeli tekst
Oznake: Dodaj oznaku
Bez oznaka, Budi prvi tko označuje ovaj zapis!