Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

Most of today’s electronic devices, like solar cells and batteries, are based on nanometer-scale built-in electric fields. Accordingly, characterization of fields at such small scales has become an important task in the optimization of these devices. In this study, with GaAs-based p−n junctions as t...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Beyer, Andreas, Munde, Manveer Singh, Firoozabadi, Saleh, Heimes, Damien, Grieb, Tim, Rosenauer, Andreas, Müller-Caspary, Knut, Volz, Kerstin
Aineistotyyppi: Artikkeli
Kieli:englanti
Julkaistu: Philipps-Universität Marburg 2021
Aiheet:
momentum-resolved STEM
4DSTEM
electric field measurements
Physik
p−n junctions
transmission electron microscopy
Physics
Linkit:PDF-kokoteksti
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Internet

PDF-kokoteksti

Saatavuus:
Hyllypaikka: urn:nbn:de:hebis:04-es2021-00265
Julkaisupäivä: 2021-11-22
Lähde: https://pubs.acs.org/doi/10.1021/acs.nanolett.0c04544
Downloads: 50 (2024), 83 (2023), 114 (2022), 15 (2021)
Lizenz: https://creativecommons.org/licenses/by-nc-sa/4.0
Linkki aineistoon: https://archiv.ub.uni-marburg.de/es/2021/0026
https://doi.org/10.17192/es2021.0026

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