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Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEM
Scanning transmission electron microscopy (STEM) is a suitable method for the quantitative characterization of nanomaterials. For an absolute composition determination on an atomic scale, the thickness of the specimen has to be known locally with high accuracy. Here, we propose a method to determine...
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| Autoren: | , , , , |
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| Format: | Artikel |
| Jezik: | angleščina |
| Izdano: |
Philipps-Universität Marburg
2019
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| Teme: | |
| Online dostop: | PDF-Volltext |
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