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Composition determination for quaternary III-V semiconductors by aberration-corrected STEM
Quantitative scanning transmission electron microscopy (STEM) is a powerful tool for the characterization of nano-materials. Absolute composition determination for ternary III–V semiconductors by direct comparison of experiment and simulation is well established. Here, we show a method to determine...
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| Autoren: | , , , |
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| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
Philipps-Universität Marburg
2019
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| Schlagworte: | |
| Online Zugang: | PDF-Volltext |
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