Publikationsserver
Composition determination for quaternary III-V semiconductors by aberration-corrected STEM
Quantitative scanning transmission electron microscopy (STEM) is a powerful tool for the characterization of nano-materials. Absolute composition determination for ternary III–V semiconductors by direct comparison of experiment and simulation is well established. Here, we show a method to determine...
Gorde:
| Egile Nagusiak: | , , , |
|---|---|
| Formatua: | Artikulua |
| Hizkuntza: | ingelesa |
| Argitaratua: |
Philipps-Universität Marburg
2019
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| Gaiak: | |
| Sarrera elektronikoa: | PDF testu osoa |
| Etiketak: |
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