Search Results - Volz, Kerstin

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  1. 1
    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions

    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions by Widemann, Maximilian

    Published 2023
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  2. 2
    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM

    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM by Firoozabadi, Seyyed Salehedin

    Published 2022
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  3. 3
    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates

    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates by Hepp, Thilo

    Published 2022
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  4. 4
    Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

    Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM by Beyer, Andreas, Munde, Manveer Singh, Firoozabadi, Saleh, Heimes, Damien, Grieb, Tim, Rosenauer, Andreas, Müller-Caspary, Knut, Volz, Kerstin

    Published 2021
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  5. 5
    Optimization of imaging conditions for composition determination by annular dark field STEM

    Optimization of imaging conditions for composition determination by annular dark field STEM by Firoozabadi, Saleh, Kükelhan, Pirmin, Hepp, Thilo, Beyer, Andreas, Volz, Kerstin

    Published 2021
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  6. 6
    Influence of plasmon excitations on atomic‑resolution quantitative 4D scanning transmission electron microscopy

    Influence of plasmon excitations on atomic‑resolution quantitative 4D scanning transmission electron microscopy by Beyer, Andreas, Krause, Florian Fritz, Robert, Hoel R., Firoozabadi, Saleh, Grieb, Tim, Kükelhan, Pirmin, Heimes, Damien, Schowalter, Marco, Müller-Caspary, Knut, Rosenauer, Andreas, Volz, Kerstin

    Published 2021
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  7. 7
    Composition determination for quaternary III-V semiconductors by aberration-corrected STEM

    Composition determination for quaternary III-V semiconductors by aberration-corrected STEM by Duschek, Lennart, Beyer, Andreas, Oelerich, Jan Oliver, Volz, Kerstin

    Published 2019
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  8. 8
    Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEM

    Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEM by Kükelhan, Pirmin, Beyer, Andreas, Firoozabadi, Saleh, Hepp, Thilo, Volz, Kerstin

    Published 2019
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  9. 9
    Segregation at interfaces in (GaIn)As/Ga(AsSb)/(GaIn)As- quantum well heterostructures explored by atomic resolution STEM

    Segregation at interfaces in (GaIn)As/Ga(AsSb)/(GaIn)As- quantum well heterostructures explored by atomic resolution STEM by Kükelhan, Pirmin, Firoozabadi, Saleh, Beyer, Andreas, Duschek, Lennart, Fuchs, Christian, Oelerich, Jan Oliver, Stolz, Wolfgang, Volz, Kerstin

    Published 2019
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  10. 10
    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE

    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE by Maßmeyer, Oliver Peter

    Published 2021
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  11. 11
    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations by Belz, Jürgen

    Published 2019
    Contributors: “…Volz, Kerstin ( Prof. Dr.)…”
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  12. 12
    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations

    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations by Duschek, Lennart

    Published 2019
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  13. 13
    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations

    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations by Kükelhan, Pirmin

    Published 2019
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  14. 14
    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics

    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics by Sterzer, Eduard

    Published 2018
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  15. 15
    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials

    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials by Straubinger, Rainer

    Published 2018
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  16. 16
    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup

    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup by Nattermann, Lukas Klaus

    Published 2017
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  17. 17
    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy

    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy by Han, Han

    Published 2017
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  18. 18
    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates

    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates by Félix Ángel, Rocío

    Published 2017
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  19. 19
    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate

    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate by Ott, Andrea

    Published 2017
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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  20. 20
    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy by Knaub, Nikolai

    Published 2016
    Contributors: “…Volz, Kerstin (Prof. Dr.)…”
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