Risultati della ricerca - Volz, Kerstin (Prof.)

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  1. 1
    Growth Dynamics and Morphology of GaP Nanowires investigated via Transmission Electron Microscopy

    Growth Dynamics and Morphology of GaP Nanowires investigated via Transmission Electron Microscopy di Krug, David Peter

    Pubblicazione 2023
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  2. 2
    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions

    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions di Widemann, Maximilian

    Pubblicazione 2023
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  3. 3
    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM

    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM di Firoozabadi, Seyyed Salehedin

    Pubblicazione 2022
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  4. 4
    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates

    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates di Hepp, Thilo

    Pubblicazione 2022
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  5. 5
    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE

    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE di Maßmeyer, Oliver Peter

    Pubblicazione 2021
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  6. 6
    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations di Belz, Jürgen

    Pubblicazione 2019
    Altri autori: “...Volz, Kerstin ( Prof. Dr.)...”
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  7. 7
    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations

    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations di Duschek, Lennart

    Pubblicazione 2019
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  8. 8
    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations

    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations di Kükelhan, Pirmin

    Pubblicazione 2019
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  9. 9
    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics

    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics di Sterzer, Eduard

    Pubblicazione 2018
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  10. 10
    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials

    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials di Straubinger, Rainer

    Pubblicazione 2018
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  11. 11
    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup

    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup di Nattermann, Lukas Klaus

    Pubblicazione 2017
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  12. 12
    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy

    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy di Han, Han

    Pubblicazione 2017
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  13. 13
    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates

    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates di Félix Ángel, Rocío

    Pubblicazione 2017
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  14. 14
    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate

    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate di Ott, Andrea

    Pubblicazione 2017
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  15. 15
    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy di Knaub, Nikolai

    Pubblicazione 2016
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  16. 16
    Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy

    Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy di Wegele, Tatjana

    Pubblicazione 2016
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  17. 17
    Growth and characterization of dilute bismide GaAs based alloys for high efficiency infra red laser diodes

    Growth and characterization of dilute bismide GaAs based alloys for high efficiency infra red laser diodes di Ludewig, Peter

    Pubblicazione 2014
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  18. 18
    Quantitative Untersuchungen der Zusammensetzung von kubischen III/V-Verbindungshalbleitern mittels HAADF-STEM

    Quantitative Untersuchungen der Zusammensetzung von kubischen III/V-Verbindungshalbleitern mittels HAADF-STEM di Fritz, Rafael

    Pubblicazione 2014
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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  19. 19
    Herstellung und Charakterisierung von metamorphen Pufferschichten für Ga(AsP)-Tandem-Solarzellen auf Si

    Herstellung und Charakterisierung von metamorphen Pufferschichten für Ga(AsP)-Tandem-Solarzellen auf Si di Ohlmann, Jens

    Pubblicazione 2013
    Altri autori: “...Volz, Kerstin (Prof.)...”
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  20. 20
    Hochaufgelöste transmissionselektronenmikroskopische Untersuchungen an Galliumphosphid auf Silizium

    Hochaufgelöste transmissionselektronenmikroskopische Untersuchungen an Galliumphosphid auf Silizium di Beyer, Andreas

    Pubblicazione 2012
    Altri autori: “...Volz, Kerstin (Prof. Dr.)...”
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