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Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate
The aim of the present study was the growth of antimony-based buffer layers with the lattice constant of InP on a GaP/Si pseudosubstrate by metal organic vapor phase epitaxy (MOVPE) and their structural investigation by atomic force microscopy (AFM), X-ray diffraction (XRD), and (scanning) transmiss...
-д хадгалсан:
| Үндсэн зохиолч: | |
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| Бусад зохиолчид: | |
| Формат: | Dissertation |
| Хэл сонгох: | англи |
| Хэвлэсэн: |
Philipps-Universität Marburg
2017
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| Нөхцлүүд: | |
| Онлайн хандалт: | PDF-н бүрэн текст |
| Шошгууд: |
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