Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate
The aim of the present study was the growth of antimony-based buffer layers with the lattice constant of InP on a GaP/Si pseudosubstrate by metal organic vapor phase epitaxy (MOVPE) and their structural investigation by atomic force microscopy (AFM), X-ray diffraction (XRD), and (scanning) transmiss...
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Formato: | Dissertation |
Idioma: | inglês |
Publicado em: |
Philipps-Universität Marburg
2017
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Acesso em linha: | Texto Completo em Formato PDF |
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Texto Completo em Formato PDFNúmero de Chamada: |
urn:nbn:de:hebis:04-z2017-01160 |
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Data de Publicação: |
2017-03-15 |
Datum der Annahme: |
2017-02-13 |
Downloads: |
79 (2024), 82 (2023), 50 (2022), 22 (2021), 4 (2020), 16 (2019), 15 (2018) |
Lizenz: |
https://rightsstatements.org/vocab/InC-NC/1.0/ |
Acessar a URL: |
https://archiv.ub.uni-marburg.de/diss/z2017/0116 https://doi.org/10.17192/z2017.0116 |