Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Energy efficiency plays a key role in the development of new industrial as well as daily life applications. There exists a strong demand for a new energy efficient generation of optoelectronic devices, especially in the growing market of internet data transfer where devices operate in the 1.55 µm...

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Bibliografske podrobnosti
Glavni avtor: Knaub, Nikolai
Drugi avtorji: Volz, Kerstin (Prof. Dr.) (BetreuerIn (Doktorarbeit))
Format: Dissertation
Jezik:angleščina
Izdano: Philipps-Universität Marburg 2016
Teme:
semiconductor physics
Raster-Transmissions-Elektronenmikroskopie
Halbleiterphysik
Verdünnte Legierung
dilute bismide alloys
III-V semiconductors
Bismut
Verbindungshalbleiter
Physik
Scanning transmission electron microscopy
Physics
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Podrobnosti zaloge
Signatura: urn:nbn:de:hebis:04-z2016-06566
Publikationsdatum: 2016-09-29
Datum der Annahme: 2016-06-23
Downloads: 103 (2024), 110 (2023), 38 (2022), 42 (2021), 33 (2020), 22 (2019), 11 (2018)
Lizenz: https://creativecommons.org/licenses/by-nc-sa/4.0
Zugangs-URL: https://archiv.ub.uni-marburg.de/diss/z2016/0656
https://doi.org/10.17192/z2016.0656

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