Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Energy efficiency plays a key role in the development of new industrial as well as daily life applications. There exists a strong demand for a new energy efficient generation of optoelectronic devices, especially in the growing market of internet data transfer where devices operate in the 1.55 µm...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Autor principal: Knaub, Nikolai
Outros Autores: Volz, Kerstin (Prof. Dr.) (Orientador)
Formato: Dissertation
Idioma:inglês
Publicado em: Philipps-Universität Marburg 2016
Assuntos:
semiconductor physics
Raster-Transmissions-Elektronenmikroskopie
Halbleiterphysik
Verdünnte Legierung
dilute bismide alloys
III-V semiconductors
Bismut
Verbindungshalbleiter
Physik
Scanning transmission electron microscopy
Physics
Acesso em linha:Texto Completo em Formato PDF
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!

Internet

Texto Completo em Formato PDF

Detalhes do Exemplar
Número de Chamada: urn:nbn:de:hebis:04-z2016-06566
Data de Publicação: 2016-09-29
Datum der Annahme: 2016-06-23
Downloads: 103 (2024), 110 (2023), 38 (2022), 42 (2021), 33 (2020), 22 (2019), 11 (2018)
Lizenz: https://creativecommons.org/licenses/by-nc-sa/4.0
Acessar a URL: https://archiv.ub.uni-marburg.de/diss/z2016/0656
https://doi.org/10.17192/z2016.0656

Registros relacionados