Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Energy efficiency plays a key role in the development of new industrial as well as daily life applications. There exists a strong demand for a new energy efficient generation of optoelectronic devices, especially in the growing market of internet data transfer where devices operate in the 1.55 µm...

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Gorde:
Xehetasun bibliografikoak
Egile nagusia: Knaub, Nikolai
Beste egile batzuk: Volz, Kerstin (Prof. Dr.) (Tesi aholkularia)
Formatua: Dissertation
Hizkuntza:ingelesa
Argitaratua: Philipps-Universität Marburg 2016
Gaiak:
semiconductor physics
Raster-Transmissions-Elektronenmikroskopie
Halbleiterphysik
Verdünnte Legierung
dilute bismide alloys
III-V semiconductors
Bismut
Verbindungshalbleiter
Physik
Scanning transmission electron microscopy
Physics
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Aleari buruzko argibideak
Sailkapena: urn:nbn:de:hebis:04-z2016-06566
Argitaratze data: 2016-09-29
Datum der Annahme: 2016-06-23
Downloads: 103 (2024), 110 (2023), 38 (2022), 42 (2021), 33 (2020), 22 (2019), 11 (2018)
Lizenz: https://creativecommons.org/licenses/by-nc-sa/4.0
URL sarbidea: https://archiv.ub.uni-marburg.de/diss/z2016/0656
https://doi.org/10.17192/z2016.0656

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