Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

Energy efficiency plays a key role in the development of new industrial as well as daily life applications. There exists a strong demand for a new energy efficient generation of optoelectronic devices, especially in the growing market of internet data transfer where devices operate in the 1.55 µm...

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Bibliographic Details
Main Author: Knaub, Nikolai
Contributors: Volz, Kerstin (Prof. Dr.) (Thesis advisor)
Format: Doctoral Thesis
Language:English
Published: Philipps-Universität Marburg 2016
Subjects:
semiconductor physics
Raster-Transmissions-Elektronenmikroskopie
Halbleiterphysik
Verdünnte Legierung
dilute bismide alloys
III-V semiconductors
Bismut
Verbindungshalbleiter
Physik
Scanning transmission electron microscopy
Physics
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Call Number: urn:nbn:de:hebis:04-z2016-06566
Publication Date: 2016-09-29
Date of Acceptance: 2016-06-23
Downloads: 103 (2024), 110 (2023), 38 (2022), 42 (2021), 33 (2020), 22 (2019), 11 (2018)
License: https://creativecommons.org/licenses/by-nc-sa/4.0
Access URL: https://archiv.ub.uni-marburg.de/diss/z2016/0656
https://doi.org/10.17192/z2016.0656

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