Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures

The first part of the thesis presents compositional evaluation of ternary quantum well structures grown on GaAs and GaP substrates using the chemical sensitive 002 dark field imaging in Transmission Electron Microscopy (TEM). The composition retrieved by the dark field intensity measurements and the...

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主要作者: Németh Igor
其他作者: Volz, Kerstin (Dr.) (BetreuerIn (Doktorarbeit))
格式: Dissertation
語言:英语
出版: Philipps-Universität Marburg 2008
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