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Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures
The first part of the thesis presents compositional evaluation of ternary quantum well structures grown on GaAs and GaP substrates using the chemical sensitive 002 dark field imaging in Transmission Electron Microscopy (TEM). The composition retrieved by the dark field intensity measurements and the...
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| フォーマット: | Dissertation |
| 言語: | 英語 |
| 出版事項: |
Philipps-Universität Marburg
2008
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| オンライン･アクセス: | PDFフルテキスト |
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