Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures

The first part of the thesis presents compositional evaluation of ternary quantum well structures grown on GaAs and GaP substrates using the chemical sensitive 002 dark field imaging in Transmission Electron Microscopy (TEM). The composition retrieved by the dark field intensity measurements and the...

Cur síos iomlán

Sábháilte in:
Sonraí bibleagrafaíochta
Príomhchruthaitheoir: Németh Igor
Rannpháirtithe: Volz, Kerstin (Dr.) (Comhairleoir tráchtais)
Formáid: Dissertation
Teanga:Béarla
Foilsithe / Cruthaithe: Philipps-Universität Marburg 2008
Ábhair:
Rochtain ar líne:An téacs iomlán mar PDF
Clibeanna: Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!