Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures
The first part of the thesis presents compositional evaluation of ternary quantum well structures grown on GaAs and GaP substrates using the chemical sensitive 002 dark field imaging in Transmission Electron Microscopy (TEM). The composition retrieved by the dark field intensity measurements and the...
Sábháilte in:
Príomhchruthaitheoir: | |
---|---|
Rannpháirtithe: | |
Formáid: | Dissertation |
Teanga: | Béarla |
Foilsithe / Cruthaithe: |
Philipps-Universität Marburg
2008
|
Ábhair: | |
Rochtain ar líne: | An téacs iomlán mar PDF |
Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
No citations were found for this record.