Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

It is illustrated that the preparation of thin specimens from bulk materials can have significant influence on the interpretability of (S)TEM data. The results of the presented measurements show that and the elastic strain relaxation in low dimensional structures alters the overall strain state of t...

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Bibliographic Details
Main Author: Belz, Jürgen
Contributors: Volz, Kerstin ( Prof. Dr.) (Thesis advisor)
Format: Dissertation
Published: Philipps-Universität Marburg 2019
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Call Number: urn:nbn:de:hebis:04-z2020-04870
Downloads: 41 (2021), 8 (2020)
Publication Date: 2020-10-14
License: According to UrhG § 31 (2), the author has granted the University Library Marburg the right of use for electronic publication on the Internet and for archiving on its archive server. He has declared that with the granting of the right of use according to UrhG § 31 (3) no exclusive rights of third parties are violated. All other rights for the exploitation of the publication remain with the author.
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