0500 Oau
1100 2017
2050 ##0##urn:nbn:de:hebis:04-z2017-07763
2051 ##0##10.17192/z2017.0776
3000 Han, Han
4000 Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy
4085 ##0##=s MB=u https://archiv.ub.uni-marburg.de/diss/z2017/0776=x H
5050 |530
5584 Kontrastsimulation
5584 Physik
5584 Auswertungsmethode
opus:7936