Surface-Assisted Chemistry at Interfaces between Metals and Organic Thin Films

Surface-Assisted Chemistry at Interfaces between Metals and Organic Thin Films

Interfaces between metals and organic thin films are of paramount importance for organic electronic devices. By photoemission spectroscopy (XPS), scanning tunneling microscopy/spectroscopy (STM/STS), temperature programmed desorption/reaction (TPD/TPR) and density functional theory calculations (DFT...

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Bibliographic Details
Main Author: Chen, Min
Contributors: Gottfried, J. Michael (Prof. Dr.) (Thesis advisor)
Format: Doctoral Thesis
Language:English
Published: Philipps-Universität Marburg 2016
Subjects:
Metallier
Ullmann-reaction
Ullmann-Kupplung
HAXPES
interphase
Corrol
Grenzphase
Porphyrine
Tiefenprofil
metal-organic interface
depth profile
Phthalocyanin
Rastertunnelmikroskopie
Röntgen-Photoelektronenspektroskopie
Chemie
Metallorganische Grenzschicht
Thermische Desorptionsspektroskopie
Chemistry & allied sciences
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Call Number: urn:nbn:de:hebis:04-z2016-01067
Publication Date: 2016-04-20
Date of Acceptance: 2016-03-24
Downloads: 71 (2024), 123 (2023), 79 (2022), 53 (2021), 59 (2020), 31 (2019), 24 (2018)
License: https://rightsstatements.org/vocab/InC-NC/1.0/
Access URL: https://archiv.ub.uni-marburg.de/diss/z2016/0106
https://doi.org/10.17192/z2016.0106

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