Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures

The first part of the thesis presents compositional evaluation of ternary quantum well structures grown on GaAs and GaP substrates using the chemical sensitive 002 dark field imaging in Transmission Electron Microscopy (TEM). The composition retrieved by the dark field intensity measurements and the...

Full description

Saved in:
Bibliographic Details
Main Author: Németh Igor
Contributors: Volz, Kerstin (Dr.) (Thesis advisor)
Format: Doctoral Thesis
Language:English
Published: Philipps-Universität Marburg 2008
Subjects:
Online Access:PDF Full Text
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

PDF Full Text

Holdings details from
Call Number: urn:nbn:de:hebis:04-z2008-01427
Publication Date: 2008-05-20
Date of Acceptance: 2008-03-18
Downloads: 52 (2024), 82 (2023), 65 (2022), 42 (2021), 33 (2020), 40 (2019), 17 (2018)
License: https://rightsstatements.org/vocab/InC-NC/1.0/
Access URL: https://archiv.ub.uni-marburg.de/diss/z2008/0142
https://doi.org/10.17192/z2008.0142