0500 Oau 1100 2007 2050 ##0##urn:nbn:de:hebis:04-z2008-00700 2051 ##0##10.17192/z2008.0070 3000 Oberhoff, Stefan 4000 Morphologie innerer Grenzflächen in verdünnt stickstoffhaltigen III/V-Materialsystemen 4085 ##0##=s MB=u https://archiv.ub.uni-marburg.de/diss/z2008/0070=x H 5050 |530 5584 Physik 5584 Ga(NAsP) 5584 Ga(NAsP) 5584 Atomic force microscopy (AFM) 5584 Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties (for structure of nanoscale materials, see 61.46.+w; for magnetic properties of interfaces, see 75.70.Cn; for superconducting properties, see 74.78.-w; for optical properties, see 78.67.-n; for transport properties, see 73.63.-b) ... ... Growth of low-dimensional structures, see 81.16.-c 5584 (GaIn)(NAs) 5584 (GaIn)(NAs) 5584 Microscopy of surfaces, interfaces, and thin films 5584 Verdünnt stickstoffhaltige III/V-Halbleiter 5584 Innere Grenzflächen 5584 Grenzflächenaktiver Stoff 5584 Selektives Ätzen 5584 III-V semiconductors 5584 (GaIn)(NAsSb) 5584 Heterostruktur 5584 Dilute nitride compound semiconductors 5584 Semiconductor lasers; laser diodes 5584 Halbleitergrenzfläche 5584 (GaIn)(NAsSb) 5584 Metastabilität 5584 Halbleiter 5584 Drei-Fünf-Halbleiter 5584 Interior interfaces opus:1890