0500 Oau
1100 2019
2050 ##0##urn:nbn:de:hebis:04-es2021-00220
2051 ##0##10.17192/es2021.0022
3000 Kükelhan, Pirmin
3000 Beyer, Andreas
3000 Firoozabadi, Saleh
3000 Hepp, Thilo
3000 Volz, Kerstin
4000 Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEM
4085 ##0##=s MB=u https://archiv.ub.uni-marburg.de/es/2021/0022=x H
5050 |530
5584 Physik
opus:10217