Search Results - Beyer, Andreas

Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM by Beyer, Andreas, Munde, Manveer Singh, Firoozabadi, Saleh, Heimes, Damien, Grieb, Tim, Rosenauer, Andreas, Müller-Caspary, Knut, Volz, Kerstin

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Optimization of imaging conditions for composition determination by annular dark field STEM by Firoozabadi, Saleh, Kükelhan, Pirmin, Hepp, Thilo, Beyer, Andreas, Volz, Kerstin

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Influence of plasmon excitations on atomic‑resolution quantitative 4D scanning transmission electron microscopy by Beyer, Andreas, Krause, Florian Fritz, Robert, Hoel R., Firoozabadi, Saleh, Grieb, Tim, Kükelhan, Pirmin, Heimes, Damien, Schowalter, Marco, Müller-Caspary, Knut, Rosenauer, Andreas, Volz, Kerstin

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Composition determination for quaternary III-V semiconductors by aberration-corrected STEM by Duschek, Lennart, Beyer, Andreas, Oelerich, Jan Oliver, Volz, Kerstin

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Simultaneous determination of local thickness and composition for ternary III-V semiconductors by aberration-corrected STEM by Kükelhan, Pirmin, Beyer, Andreas, Firoozabadi, Saleh, Hepp, Thilo, Volz, Kerstin

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Segregation at interfaces in (GaIn)As/Ga(AsSb)/(GaIn)As- quantum well heterostructures explored by atomic resolution STEM by Kükelhan, Pirmin, Firoozabadi, Saleh, Beyer, Andreas, Duschek, Lennart, Fuchs, Christian, Oelerich, Jan Oliver, Stolz, Wolfgang, Volz, Kerstin

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Hochaufgelöste transmissionselektronenmikroskopische Untersuchungen an Galliumphosphid auf Silizium by Beyer, Andreas

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