APA Citation

Kükelhan, P., & Volz, K. (. D. (2019). Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg.

Chicago Style Citation

Kükelhan, Pirmin, and Kerstin (Prof. Dr.) Volz. Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg, 2019.

MLA Citation

Kükelhan, Pirmin, and Kerstin (Prof. Dr.) Volz. Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations. Philipps-Universität Marburg, 2019.

Warning: These citations may not always be 100% accurate.