APA Citation

Han, H., & Volz, K. (. D. (2017). Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy. Philipps-Universität Marburg.

Chicago Style Citation

Han, Han, and Kerstin (Prof. Dr.) Volz. Quantitative Evaluation of the Interfaces in III/V Semiconductors With Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2017.

MLA Citation

Han, Han, and Kerstin (Prof. Dr.) Volz. Quantitative Evaluation of the Interfaces in III/V Semiconductors With Scanning Transmission Electron Microscopy. Philipps-Universität Marburg, 2017.

Warning: These citations may not always be 100% accurate.