Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy
In order to understand the principles of HAADF imaging and also to implement the contrast simulations efficiently and effectively, simulations about HAADF imaging are carried out. The results clearly show that TDS can significantly influence the collected intensity at the detector. In order to in...
Gespeichert in:
主要作者: | |
---|---|
其他作者: | |
格式: | Dissertation |
语言: | 英语 |
出版: |
Philipps-Universität Marburg
2017
|
主题: | |
在线阅读: | PDF-Volltext |
标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
No citations were found for this record.