Publikationsserver
Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy
In order to understand the principles of HAADF imaging and also to implement the contrast simulations efficiently and effectively, simulations about HAADF imaging are carried out. The results clearly show that TDS can significantly influence the collected intensity at the detector. In order to in...
Сохранить в:
| Главный автор: | |
|---|---|
| Другие авторы: | |
| Формат: | Dissertation |
| Язык: | английский |
| Опубликовано: |
Philipps-Universität Marburg
2017
|
| Предметы: | |
| Online-ссылка: | PDF-полный текст |
| Метки: |
Добавить метку
Нет меток, Требуется 1-ая метка записи!
|
No citations were found for this record.