Publikationsserver
Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy
In order to understand the principles of HAADF imaging and also to implement the contrast simulations efficiently and effectively, simulations about HAADF imaging are carried out. The results clearly show that TDS can significantly influence the collected intensity at the detector. In order to in...
-д хадгалсан:
| Үндсэн зохиолч: | |
|---|---|
| Бусад зохиолчид: | |
| Формат: | Dissertation |
| Хэл сонгох: | англи |
| Хэвлэсэн: |
Philipps-Universität Marburg
2017
|
| Нөхцлүүд: | |
| Онлайн хандалт: | PDF-н бүрэн текст |
| Шошгууд: |
Шошго нэмэх
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
|
No citations were found for this record.