Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy

In order to understand the principles of HAADF imaging and also to implement the contrast simulations efficiently and effectively, simulations about HAADF imaging are carried out. The results clearly show that TDS can significantly influence the collected intensity at the detector. In order to in...

Whakaahuatanga katoa

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Kaituhi matua: Han, Han
Ētahi atu kaituhi: Volz, Kerstin (Prof. Dr.) (BetreuerIn (Doktorarbeit))
Hōputu: Dissertation
Reo:Ingarihi
I whakaputaina: Philipps-Universität Marburg 2017
Ngā marau:
Urunga tuihono:Kuputuhi katoa PDF
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