Publikationsserver
Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy
In order to understand the principles of HAADF imaging and also to implement the contrast simulations efficiently and effectively, simulations about HAADF imaging are carried out. The results clearly show that TDS can significantly influence the collected intensity at the detector. In order to in...
Salvato in:
| Autore principale: | |
|---|---|
| Altri autori: | |
| Natura: | Dissertation |
| Lingua: | inglese |
| Pubblicazione: |
Philipps-Universität Marburg
2017
|
| Soggetti: | |
| Accesso online: | PDF Full Text |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
|
No citations were found for this record.