Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy

In order to understand the principles of HAADF imaging and also to implement the contrast simulations efficiently and effectively, simulations about HAADF imaging are carried out. The results clearly show that TDS can significantly influence the collected intensity at the detector. In order to in...

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Bibliografski detalji
Glavni autor: Han, Han
Daljnji autori: Volz, Kerstin (Prof. Dr.) (Savjetnik disertacije)
Format: Dissertation
Jezik:engleski
Izdano: Philipps-Universität Marburg 2017
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