Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures

The first part of the thesis presents compositional evaluation of ternary quantum well structures grown on GaAs and GaP substrates using the chemical sensitive 002 dark field imaging in Transmission Electron Microscopy (TEM). The composition retrieved by the dark field intensity measurements and the...

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Bibliographic Details
Main Author: Németh Igor
Contributors: Volz, Kerstin (Dr.) (Thesis advisor)
Format: Dissertation
Language:English
Published: Philipps-Universität Marburg 2008
Physik
Subjects:
TEM
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Call Number: http://archiv.ub.uni-marburg.de/diss/z2008/0142
https://doi.org/10.17192/z2008.0142
urn:nbn:de:hebis:04-z2008-01427
Downloads: 8 (2019), 17 (2018), 38 (2017), 28 (2016)
Publication Date: 2008-05-20
License: According to UrhG § 31 (2), the author has granted the University Library Marburg the right of use for electronic publication on the Internet and for archiving on its archive server. He has declared that with the granting of the right of use according to UrhG § 31 (3) no exclusive rights of third parties are violated. All other rights for the exploitation of the publication remain with the author.