0500 Oau 1100 2008 2050 ##0##urn:nbn:de:hebis:04-z2008-01427 2051 ##0##10.17192/z2008.0142 3000 NĂ©meth Igor 4000 Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures 4085 ##0##=s MB=u https://archiv.ub.uni-marburg.de/diss/z2008/0142=x H 5050 |530 5584 Verfeinerte Strukturfaktorberechnungen 5584 Physik 5584 TEM 5584 Heteroepitaxie 5584 Durchstrahlungselektronenmikroskopie 5584 Planardefekte 5584 Strukturfaktor 5584 Planar defects 5584 TEM 5584 Gitterbaufehler 5584 Refined structure factor calculations opus:1977